journal：IEEE Transactions on Information Forensics and Security
Authors： Di Wen; Hu Han; Anil K. Jain
Published date：2015-4-
DOI：10.1109/tifs.2015.2400395
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=7031384
Article link：http://dx.doi.org/10.1109/tifs.2015.2400395
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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