journal£ºIEEE Transactions on Reliability
Authors£ºHuimin Zhao; Jie Liu; Huayue Chen; Jie Chen; Yang Li; Junjie Xu; Wu Deng
Published date£º2023-6-
DOI£º10.1109/tr.2022.3180273
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9794825
Article link£ºhttp://dx.doi.org/10.1109/tr.2022.3180273
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |