journal：IEEE Access
Authors：Hector Vargas; Ruben Heradio; Jesus Chacon; Luis De La Torre; Gonzalo Farias; Daniel Galan; Sebastian Dormido
Published date：2019--
DOI：10.1109/access.2019.2908160
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=8675984
Article link：http://dx.doi.org/10.1109/access.2019.2908160
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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