journal£ºIEEE Systems Journal
Authors£ºJean-Franeois Toubeau; Thuy-Hai Nguyen; Hooman Khaloie; Yi Wang; Franeois Vallee
Published date£º2022-12-
DOI£º10.1109/jsyst.2021.3114445
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9580751
Article link£ºhttp://dx.doi.org/10.1109/jsyst.2021.3114445
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |