journal:IEEE Transactions on Instrumentation and Measurement
Authors:Batu Candan; Halil Ersin Soken
Published date:2021--
DOI:10.1109/tim.2021.3104042
Article link:http://dx.doi.org/10.1109/tim.2021.3104042
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
Remark: |