journal£ºIEEE Transactions on Information Forensics and Security
Authors£ºTsung-Hsien Lin; Ying-Shuo Lee; Fu-Chieh Chang; J. Morris Chang; Pei-Yuan Wu
Published date£º2023
DOI£º10.1109/tifs.2023.3236180
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10015066
Article link£ºhttp://dx.doi.org/10.1109/tifs.2023.3236180
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
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