[Emerald] An in situ surface defect detection method based on improved you only look once algorithm for wire and arc additive manufacturing

Trad1998 Post time 2024-4-28 04:38:55 | Show all posts |Read mode
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journal:Rapid Prototyping Journal

Authors:Jun Wu; Cheng Huang; Zili Li; Runsheng Li; Guilan Wang; Haiou Zhang

Published date:2023-5-2

DOI:10.1108/rpj-06-2022-0211

PDF link:https://www.emerald.com/insight/ ... -2022-0211/full/xml

Article link:http://dx.doi.org/10.1108/rpj-06-2022-0211

Article Source:Emerald


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green69 Post time 2024-4-28 04:38:56 | Show all posts

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