journal:IEEE Access
Authors:Ruhul Amin; Md. Shamim Reza; Md. Maniruzzaman; Md. Al Mehedi Hasan; Hyoun-Sup Lee; Si-Woong Jang; Jungpil Shin
Published date:2023--
DOI:10.1109/access.2023.3336422
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10328576
Article link:http://dx.doi.org/10.1109/access.2023.3336422
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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