journal：IEEE Access
Authors：Md. Jaber Al Nahian; Tapotosh Ghosh; Md. Hasan Al Banna; Mohammed A. Aseeri; Mohammed Nasir Uddin; Muhammad Raisuddin Ahmed; Mufti Mahmud; M. Shamim Kaiser
Published date：2021--
DOI：10.1109/access.2021.3056441
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9344695
Article link：http://dx.doi.org/10.1109/access.2021.3056441
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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