journal:IEEE Access
Authors:Carla Taramasco; Tomas Rodenas; Felipe Martinez; Paola Fuentes; Roberto Munoz; Rodrigo Olivares; Victor Hugo C. De Albuquerque; Jacques Demongeot
Published date:2018--
DOI:10.1109/access.2018.2861331
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=8423052
Article link:http://dx.doi.org/10.1109/access.2018.2861331
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
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