[Other] Investigation of Leakage Current in Micro M-I-M Structure Using Multilayer High-K Dielectric Materials with COMSOL Multiphysics

AthulNakulan Post time 2024-4-26 19:12:37 | Show all posts |Read mode
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journal:Elektronika ir Elektrotechnika

Authors:Naqeeb Ullah; Lingling Huang; Muhammad Rizwan Amirzada; Anayat Ullah; Muhammad Luqman Haider; Muhammad Khurram Ehsan; Yousuf Khan

Published date:--

DOI:10.5755/j02.eie.28102

PDF link:https://eejournal.ktu.lt/index.p ... ownload/28102/15276

Article link:http://dx.doi.org/10.5755/j02.eie.28102

Article Source:Kaunas University of Technology (KTU)


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