journal£ºIEEE Transactions on Reliability
Authors£ºLama J. Moukahal; Mohammad Zulkernine; Martin Soukup
Published date£º2021-12-
DOI£º10.1109/tr.2021.3112538
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9557794
Article link£ºhttp://dx.doi.org/10.1109/tr.2021.3112538
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |