journal£ºIEEE Transactions on Reliability
Authors£ºJinfu Chen; Jiaping Xu; Saihua Cai; Xiaoli Wang; Haibo Chen; Zhehao Li
Published date£º2024--
DOI£º10.1109/tr.2024.3356515
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10423566
Article link£ºhttp://dx.doi.org/10.1109/tr.2024.3356515
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |