[IEEE] Software Defect Prediction Approach Based on a Diversity Ensemble Combined With Neural Network

dhivyanatesan78 Post time 2024-4-26 00:55:10 | Show all posts |Read mode
Reward20points

journal£ºIEEE Transactions on Reliability

Authors£ºJinfu Chen; Jiaping Xu; Saihua Cai; Xiaoli Wang; Haibo Chen; Zhehao Li

Published date£º2024--

DOI£º10.1109/tr.2024.3356515

PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10423566

Article link£ºhttp://dx.doi.org/10.1109/tr.2024.3356515

Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£


Remark£º

Best Answer

Please adopt

View Full Content

Reply

Use magic Donate Report

All Reply1 Show all posts
George Post time 2024-4-26 00:55:11 | Show all posts

This post has been completed

Completed attachments will be deleted within 24 hours.
Reply

Use magic Donate Report


Senior Member
  • post

  • reply

  • points

    2480

Latest Reply



Return to the list