journal:IEEE Transactions on Reliability
Authors:Zhanyu Yang; Lu Lu; Quanyi Zou
Published date:2024-3-
DOI:10.1109/tr.2023.3272651
PDF link:https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10129864
Article link:http://dx.doi.org/10.1109/tr.2023.3272651
Article Source:Institute of Electrical and Electronics Engineers (IEEE)。
Remark: |