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[IEEE] Numerical analysis of the Impact of Gate Geometry variations on the Reliability of AlGaN/GaN HEMT

alok09001 Post time 2024-4-25 18:07:52 | Show all posts |Read mode
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journal£º2021 IEEE 4th International Conference on Computing, Power and Communication Technologies (GUCON)

Authors£ºSushanta Bordoloi; Ashok Ray; Gaurav Trivedi

Published date£º2021-9-24

DOI£º10.1109/gucon50781.2021.9573607

PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9573607

Article link£ºhttp://dx.doi.org/10.1109/gucon50781.2021.9573607

Article Source£ºIEEE¡£


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Georgee Junior Member
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Georgee Post time 2024-4-25 18:07:53 | Show all posts

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