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[IEEE] Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs With Field Plate

alok09001 Post time 2024-4-25 17:51:53 | Show all posts |Read mode
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journal£ºIEEE Transactions on Device and Materials Reliability

Authors£ºSushanta Bordoloi; Ashok Ray; Gaurav Trivedi

Published date£º2022-3-

DOI£º10.1109/tdmr.2022.3150714

PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9709598

Article link£ºhttp://dx.doi.org/10.1109/tdmr.2022.3150714

Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£


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Georgee Junior Member
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Georgee Post time 2024-4-25 17:51:54 | Show all posts

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