Detecting Deepfakes With ResNext and LSTM: An Enhanced Feature Extraction and Classification Framework

Post time 2024-4-25 17:06:50

journal：2023 International Conference on Signal Processing, Computation, Electronics, Power and Telecommunication (IConSCEPT)

Authors：Rusheek Taviti; Satvik Taviti; Pagala Ajay Reddy; Nandivada Ravi Sankar; Thavisala Veneela; Panagatla Baltej Goud

Published date：2023-5-25

DOI：10.1109/iconscept57958.2023.10170580

PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10170580

Article link：http://dx.doi.org/10.1109/iconscept57958.2023.10170580

Article Source：IEEE。

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Post time 2024-4-25 17:06:51

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[IEEE] Detecting Deepfakes With ResNext and LSTM: An Enhanced Feature Extraction and Classification Framework

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