journal£ºIEEE Transactions on Instrumentation and Measurement
Authors£ºShaolin Ran; Xiaoyun Yang; Ming Liu; Yong Zhang; Cheng Cheng; Hongling Zhu; Ye Yuan
Published date£º2022--
DOI£º10.1109/tim.2022.3147328
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9705202
Article link£ºhttp://dx.doi.org/10.1109/tim.2022.3147328
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |