journal£ºIEEE Transactions on Instrumentation and Measurement
Authors£ºEnes Yigit; Huseyin Duysak
Published date£º2022--
DOI£º10.1109/tim.2022.3165740
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9751744
Article link£ºhttp://dx.doi.org/10.1109/tim.2022.3165740
Remark£ºArticle Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
|