journal£ºIEEE Access
Authors£ºAndreas Livera; Marios Theristis; Leonardo Micheli; Eduardo F. Fernandez; Joshua S. Stein; George E. Georghiou
Published date£º2022--
DOI£º10.1109/access.2022.3168140
PDF link£ºhttps://ieeexplore.ieee.org/ielam/6287639/9668973/9758804-aam.pdf
Article link£ºhttp://dx.doi.org/10.1109/access.2022.3168140
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |