[IEEE] Impact of p-Gate Contact in GaN-HEMTs on Overvoltage Stress Failure

Shanija Post time 2024-4-24 16:30:52 | Show all posts |Read mode
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journal£ºIEEE Transactions on Electron Devices

Authors£ºWataru Saito; Shin-ichi Nishizawa

Published date£º2024--

DOI£º10.1109/ted.2024.3388383

PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10502353

Article link£ºhttp://dx.doi.org/10.1109/ted.2024.3388383

Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£


Remark£ºNeed

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