[SPIE] Modal approach based on global stereocorrelation for defects measurement in wire-laser additive manufacturing

thinhpfiev2003 Post time 2024-4-18 22:27:04 | Show all posts |Read mode
Reward10points

journal£ºJournal of Electronic Imaging

Authors£ºKhalil Hachem; Yann Quinsat; Christophe Tournier; Nicolas B¨¦raud

Published date£º2024-3-15

DOI£º10.1117/1.jei.33.3.031206

Article link£ºhttp://dx.doi.org/10.1117/1.jei.33.3.031206

Article Source£ºSPIE-Intl Soc Optical Eng¡£


Remark£º

Best Answer

Please adopt

View Full Content

Reply

Use magic Donate Report

All Reply1 Show all posts
Dragon2000 Post time 2024-4-18 22:27:05 | Show all posts

This post has been completed

Completed attachments will be deleted within 24 hours.
Reply

Use magic Donate Report


Senior Member
  • post

  • reply

  • points

    750

Latest Reply



Return to the list