journal：IEEE Transactions on Industrial Informatics
Authors：Randhir Kumar; Prabhat Kumar; Rakesh Tripathi; Govind P. Gupta; A. K. M. Najmul Islam; Mohammad Shorfuzzaman
Published date：2022-11-
DOI：10.1109/tii.2022.3161631
PDF link：https://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9740491
Article link：http://dx.doi.org/10.1109/tii.2022.3161631
Article Source：Institute of Electrical and Electronics Engineers (IEEE)。
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