journal£ºIEEE Micro
Authors£ºPrabhat Kumar; Govind P. Gupta; Rakesh Tripathi
Published date£º2022-1-1
DOI£º10.1109/mm.2021.3112476
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9540342
Article link£ºhttp://dx.doi.org/10.1109/mm.2021.3112476
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |