journal£ºAM&P Technical Articles
Authors£ºRyan Dehoff; Chad Duty; William Peter; Yukinori Yamamoto; Wei Chen; Craig Blue; Cory Tallman
Published date£º2013-3-1
DOI£º10.31399/asm.amp.2013-03.p019
PDF link£ºhttps://dl.asminternational.org/ ... mp.2013-03.p019.pdf
Article link£ºhttp://dx.doi.org/10.31399/asm.amp.2013-03.p019
Article Source£ºASM International¡£
Remark£º |