journal£ºIEEE Transactions on Instrumentation and Measurement
Authors£ºWei Luo; Haiming Yao; Wenyong Yu
Published date£º2023--
DOI£º10.1109/tim.2023.3268658
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10106037
Article link£ºhttp://dx.doi.org/10.1109/tim.2023.3268658
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |