[IEEE] Normal Reference Attention and Defective Feature Perception Network for Surface Defect Detection

yjphhw Post time 2023-6-9 22:24:48 | Show all posts |Read mode
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journal£ºIEEE Transactions on Instrumentation and Measurement

Authors£ºWei Luo; Haiming Yao; Wenyong Yu

Published date£º2023--

DOI£º10.1109/tim.2023.3268658

PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10106037

Article link£ºhttp://dx.doi.org/10.1109/tim.2023.3268658

Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£


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