journal£ºIEEE Systems Journal
Authors£ºShuohan Liu; Qiang Ni; Yue Cao; Jixing Cui; Daxin Tian; Yuan Zhuang
Published date£º2022--
DOI£º10.1109/jsyst.2022.3145155
Article link£ºhttp://dx.doi.org/10.1109/jsyst.2022.3145155
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |