[Other] Effects of Bottom Electrode Materials on the Resistive Switching Characteristics of HfO2-Based RRAM Devices

nive1ak Post time 2024-5-10 16:49:44 | Show all posts |Read mode
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Journal: Journal of electronic materials
Authors: Arun, N., Nageswara Rao, S.V.S. & Pathak, A.P.

Date: February 2023

Article link: https://link.springer.com/article/10.1007/s11664-022-10136-5

DOI: https://doi.org/10.1007/s11664-022-10136-5


Article source: Springer

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smahata Post time 2024-5-10 16:49:45 | Show all posts

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