[Elsevier] Analysis of dislocation configurations in SiC crystals through X-ray topography aided by ray tracing simulations

xsjj Post time 2024-5-10 04:39:44 | Show all posts |Read mode
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journal£ºMaterials Science in Semiconductor Processing

Authors£ºQianyu Cheng; Zeyu Chen; Shanshan Hu; Yafei Liu; Balaji Raghothamachar; Michael Dudley

Published date£º2024-5-

DOI£º10.1016/j.mssp.2024.108207

PDF link£ºhttps://www.sciencedirect.com/sc ... 369800124001033/pdf

Article link£ºhttp://dx.doi.org/10.1016/j.mssp.2024.108207

Article Source£ºElsevier BV¡£


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susmitbasu Post time 2024-5-10 04:39:45 | Show all posts

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