journal£ºIEEE Design & Test
Authors£ºShruti Y. Narayana; Sumit K. Mandal; Raid Ayoub; Mohammad M. Islam; Michael Kishinevsky; Umit Y. Ogras
Published date£º2023-12-
DOI£º10.1109/mdat.2023.3310167
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10234451
Article link£ºhttp://dx.doi.org/10.1109/mdat.2023.3310167
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |