journal£ºProceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614)
Authors£ºJ. Gambino; A. Stamper; T. McDevitt; V. McGahay; S. Luce; T. Pricer; B. Porth; C. Senowitz; R. Kontra; M. Gibson; H. Wildman; A. Piper; C. Benson; T. Standaert; P. Biolsi; E. Cooney
Published date£º--
DOI£º10.1109/ipfa.2002.1025628
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=1025628
Article link£ºhttp://dx.doi.org/10.1109/ipfa.2002.1025628
Article Source£ºIEEE¡£
Remark£º |