journal£º2023 IEEE 41st VLSI Test Symposium (VTS)
Authors£ºLeon Li; Alex Orailoglu
Published date£º2023-4-24
DOI£º10.1109/vts56346.2023.10139952
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10139952
Article link£ºhttp://dx.doi.org/10.1109/vts56346.2023.10139952
Article Source£ºIEEE¡£
Remark£º |