journal£ºIEEE Access
Authors£ºSouheil Fenghour; Daqing Chen; Kun Guo; Bo Li; Perry Xiao
Published date£º2021--
DOI£º10.1109/access.2021.3107946
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9522117
Article link£ºhttp://dx.doi.org/10.1109/access.2021.3107946
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |
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