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[IOP] Smart voltammetric procedure in an automatic trace metal monitoring system for expanding the measurement range of a gold-band microelectrode array

raysajo Post time 2024-5-2 22:29:36 | Show all posts |Read mode
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journal£ºMeasurement Science and Technology

Authors£ºWen Zhang; Hao Wan; Qiyong Sun; Da Ha; Ping Wang; Dmitry Kirsanov; Andrey Legin

Published date£º2013-4-1

DOI£º10.1088/0957-0233/24/4/045801

PDF link£ºhttp://stacks.iop.org/0957-0233/24/i=4/a=045801/pdf

Article link£ºhttp://dx.doi.org/10.1088/0957-0233/24/4/045801

Article Source£ºIOP Publishing¡£


Remark£º

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ankitapal1710 Junior Member
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ankitapal1710 Post time 2024-5-2 22:29:37 | Show all posts

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