Reliability Analysis of Large-Area, Low-Pressure-Assisted Silver Sintering for Medium-Voltage Power Modules

Post time 2024-5-2 18:33:33

journal：IEEE Journal of Emerging and Selected Topics in Power Electronics

Authors：Jacob Gersh; Christina DiMarino; Douglas DeVoto; Paul P. Paret; Joshua Major

Published date：2022-10-

DOI：10.1109/jestpe.2021.3133817

PDF link：https://ieeexplore.ieee.org/ielam/6245517/9908063/9642227-aam.pdf

Article link：http://dx.doi.org/10.1109/jestpe.2021.3133817

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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Post time 2024-5-2 18:33:34

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[IEEE] Reliability Analysis of Large-Area, Low-Pressure-Assisted Silver Sintering for Medium-Voltage Power Modules

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