journal£ºIEEE Transactions on Instrumentation and Measurement
Authors£ºHui Li; Shuai Chang; Qi Yao; Chengcheng Wan; Guo-Ji Zou; Da-Long Zhang
Published date£º2024--
DOI£º10.1109/tim.2024.3381659
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10478937
Article link£ºhttp://dx.doi.org/10.1109/tim.2024.3381659
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |