[IEEE] A Novel Program Scheme to Optimize Program Disturbance in Dual-Deck 3D NAND Flash Memory

kans1234 Post time 2024-5-2 15:22:37 | Show all posts |Read mode
Reward10points

journal£ºIEEE Electron Device Letters

Authors£ºXinlei Jia; Lei Jin; Jianquan Jia; Kaikai You; Kaiwei Li; Shan Li; Yali Song; Yuanyuan Min; Ying Cui; Wenzhe Wei; Xiangnan Zhao; Weiming Chen; Hongtao Liu; An Zhang; Zongliang Huo

Published date£º2022-7-

DOI£º10.1109/led.2022.3178155

PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9782870

Article link£ºhttp://dx.doi.org/10.1109/led.2022.3178155

Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£


Remark£º

Best Answer

Please adopt

View Full Content

Reply

Use magic Donate Report

All Reply1 Show all posts
AliAliTN Post time 2024-5-2 15:22:38 | Show all posts

This post has been completed

Completed attachments will be deleted within 24 hours.
Reply

Use magic Donate Report

Junior Member
  • post

  • reply

  • points

    90

Latest Reply

Return to the list