journal£ºIEEE Transactions on Electron Devices
Authors£ºChao Wang; Junfeng Hu; Ziyu Liu; Xiaojin Li; Yanling Shi; Yabin Sun
Published date£º2024-5-
DOI£º10.1109/ted.2024.3375829
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10475901
Article link£ºhttp://dx.doi.org/10.1109/ted.2024.3375829
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |