[IEEE] TCAD Simulations of Reconfigurable Field-Effect Transistor With Embedded-Fin-Contact to Improve On-Current

.rr.at.onia Post time 2024-5-1 00:46:31 | Show all posts |Read mode
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journal£ºIEEE Transactions on Electron Devices

Authors£ºChao Wang; Junfeng Hu; Ziyu Liu; Xiaojin Li; Yanling Shi; Yabin Sun

Published date£º2024-5-

DOI£º10.1109/ted.2024.3375829

PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10475901

Article link£ºhttp://dx.doi.org/10.1109/ted.2024.3375829

Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£


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George Post time 2024-5-1 00:46:32 | Show all posts

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