journal£ºIEEE Journal of Solid-State Circuits
Authors£ºWeiwei Shan; Junyi Qian; Lixuan Zhu; Jun Yang; Cheng Huang; Hao Cai
Published date£º2023-3-
DOI£º10.1109/jssc.2022.3197838
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9888232
Article link£ºhttp://dx.doi.org/10.1109/jssc.2022.3197838
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |