journal£ºIEEE Access
Authors£ºN. K. Ibrahim; N. S. Jalood; M. J. Baqer; Shahad Nidhal; E. M. Almahdi; Musaab Alaa; Hamsa Hammed; A. A. Zaidan; B. B. Zaidan; O. S. Albahri; M. A. Alsalem; R. T. Mohammed; Ali Najm Jasim; Ali H. Shareef
Published date£º2019--
DOI£º10.1109/access.2019.2941640
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=8839042
Article link£ºhttp://dx.doi.org/10.1109/access.2019.2941640
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |