journal£ºIEEE Network
Authors£ºRui Han; Lin Bai; Chunxiao Jiang; Jianwei Liu; Jinho Choi
Published date£º2021-7-
DOI£º10.1109/mnet.011.2100076
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9520345
Article link£ºhttp://dx.doi.org/10.1109/mnet.011.2100076
Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£
Remark£º |
10