[Other] Optical Beam Induced Current Applications For Failure Analysis of VLSI Devices

 Close Closed
Reed1942 Post time 2024-4-29 17:47:36 | Show all posts |Read mode
Reward25points

Edited by Reed1942 at 2024-4-29 18:05

Authors: K.S. Wills, T. Lewis, G. Billus, H. Hoang


Year: 1990

Published in: Proceedings of International Symposium for Testing and Failure Analysis


Page 21 of the Proceedings

Sorry, I do not have the DOI nor any additional information.
Reply

Use magic Donate Report

All Reply0 Show all posts

Reply

You have to log in before you can reply Login | Register

Points Rules

Junior Member
  • post

  • reply

  • points

    50

Latest Reply


Return to the list