journal£º2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Authors£ºGia Bao Thieu; Sven Gesper; Guillermo Pay¨¢-Vay¨¢; Christoph Riggers; Oliver Renke; Till Fiedler; Jakob Marten; Tobias Stuckenberg; Holger Blume; Christian Weis; Lukas Steiner; Chirag Sudarshan; Norbert Wehn; Lennart M. Reimann; Rainer Leupers; Michael Beyer; Daniel Kohler; Alisa Jauch; Jan Micha Borrmann; Setareh Jaberansari; Tim Berthold; Meinolf Blawat; Markus Kock; Gregor Schewior; Jens Benndorf; Frederik Kautz; Hans-Martin Bluethgen; Christian Sauer
Published date£º2023-4-
DOI£º10.23919/date56975.2023.10136978
PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=10136978
Article link£ºhttp://dx.doi.org/10.23919/date56975.2023.10136978
Article Source£ºIEEE¡£
Remark£º |