[SPIE] Defect detection of precision optics by bright-dark-field structured illumination microscopy

Kerringli Post time 2024-4-4 16:41:46 | Show all posts |Read mode
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journal£ºConference on Infrared, Millimeter, Terahertz Waves and Applications (IMT2022)

Authors£ºLulu Li; Ke Zhang; Qian Liu

Published date£º2023-4-12

DOI£º10.1117/12.2662336

Article link£ºhttp://dx.doi.org/10.1117/12.2662336

Article Source£ºSPIE¡£


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librarian123 Post time 2024-4-4 16:41:47 | Show all posts

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