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[IEEE] AC NEGF Simulation of Nanosheet MOSFETs

Joyprokash Post time 2023-6-9 20:08:21 | Show all posts |Read mode
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journal£º2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Authors£ºSung-Min Hong; Phil-Hun Ahn

Published date£º2020-9-23

DOI£º10.23919/sispad49475.2020.9241656

PDF link£ºhttps://ieeexplore.ieee.org/stampPDF/getPDF.jsp?arnumber=9241656

Article link£ºhttp://dx.doi.org/10.23919/sispad49475.2020.9241656

Article Source£ºIEEE¡£


Remark£º

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