[IEEE] Redefining Monitoring Rules for Intelligent Fault Detection and Classification via CNN Transfer Learning for Smart Manufacturing

hoanglinh96nl Post time 2022-12-1 23:26:06 | Show all posts |Read mode
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journal£ºIEEE Transactions on Semiconductor Manufacturing

Authors£ºChen-Fu Chien; Wei-Tse Hung; Eddy Ting-Yi Liao

Published date£º2022-5-

DOI£º10.1109/tsm.2022.3164904

Article link£ºhttp://dx.doi.org/10.1109/tsm.2022.3164904

Article Source£ºInstitute of Electrical and Electronics Engineers (IEEE)¡£


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David Post time 2022-12-1 23:26:07 | Show all posts

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