Impact of the Figures of Merit (FoMs) Definitions on the Variability in Nanowire TFET: NEGF Simulation Study

Post time 2022-11-25 14:39:54

journal：IEEE Transactions on Electron Devices

Authors：Yunhe Guan; Vihar P. Georgiev; Asen Asenov; Feng Liang; Haifeng Chen

Published date：2022-11-

DOI：10.1109/ted.2022.3204596

Article link：http://dx.doi.org/10.1109/ted.2022.3204596

Article Source：Institute of Electrical and Electronics Engineers (IEEE)。

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[IEEE] Impact of the Figures of Merit (FoMs) Definitions on the Variability in Nanowire TFET: NEGF Simulation Study

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